Defect Inspection Equipment - Company Ranking(45 companies in total)

Last Updated：Jan 14, 2026 Aggregation Period:Dec 17, 2025〜Jan 13, 2026
This ranking is based on the number of page views on our site.

Company Name	Company information	Featured Products
Company Name	Company information	Product Image, Product Name, Price Range	overview	Application/Performance example
山梨技術工房	Address Yamanashi/ number of employees 25 Business Activities - Wafer surface particle scanner YPI-MN, YPI-MX, YPI-MX-DC - Pellicle particle scanner YPI-MX-P - Prober for thermal head - ... Key Partners	Wafer Surface Particle Scanner YPI-MX 10 million yen-50 million yen	Detection sensitivity: 0.1μm (bare silicon) Laser wavelength: 405nm Wafer size: 2-8 inches (up to 200mm square substrate) (There are r...	Confirmation of particles after wafer cleaning. Contamination check of semiconductor process equipment chambers (process monitor). Confi...
		Wafer Surface Particle Scanner YPI-MN 10 million yen-50 million yen	Detection sensitivity: 0.15μm (bare silicon) Laser wavelength: 405nm Compatible wafer sizes: 2-8 inches, square substrates within 200mm....	Confirmation of particles after wafer and substrate cleaning. Confirmation of contamination in the process equipment chamber. Confirmati...
		Wafer Surface Particle Scanner YPI-MX-DC 10 million yen-50 million yen	Detection sensitivity: 0.1μm (SiC bulk, bare silicon) Laser wavelength: 355nm Wafer size: 8 inches or smaller External dimensions: (W)...	Confirmation of cleaning for SiC/GaN wafers. Confirmation of contamination in the SiC process equipment chamber (process monitor). Confi...
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